diffract suite eva software package Search Results


eva software  (Bruker Corporation)
96
Bruker Corporation eva software
Eva Software, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/diffract+suite+eva+software+package/10__1016_slash_j__jmrt__2021__04__078-82-6-5?v=Bruker+Corporation
Average 96 stars, based on 1 article reviews
eva software - by Bioz Stars, 2026-07
96/100 stars
  Buy from Supplier
bruker d8 advance diffractometer  (Bruker Corporation)
99
Bruker Corporation bruker d8 advance diffractometer
Figure 3. XRD patterns and XPS spectra of the substrate (Ctrl sample), MA01 and MA01-blasting: (A) XRD patterns after MAO coating (sample MA01), (B) XRD patterns after removal of the outer layer by blasting (sample MA01-blasting), (C) XPS spectrum Ti 2p, (D) XPS spectrum O 1s, (E) XPS spectrum Si 2p. Bruker <t>D8</t> Advance <t>diffractometer</t> (DIFFRAC.SUITE EVA V3—XRD Software, www.bruker.com), XPS (X-ray Photoelectron Spectroscopy) and Omicron EA-125 electron energy analyser and a dual anode X-ray source (XPS Lab, www.scientaomicron.com).
Bruker D8 Advance Diffractometer, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/diffract+suite+eva+software+package/pm33188241-128-0-0?v=Bruker+Corporation
Average 99 stars, based on 1 article reviews
bruker d8 advance diffractometer - by Bioz Stars, 2026-07
99/100 stars
  Buy from Supplier

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Figure 3. XRD patterns and XPS spectra of the substrate (Ctrl sample), MA01 and MA01-blasting: (A) XRD patterns after MAO coating (sample MA01), (B) XRD patterns after removal of the outer layer by blasting (sample MA01-blasting), (C) XPS spectrum Ti 2p, (D) XPS spectrum O 1s, (E) XPS spectrum Si 2p. Bruker D8 Advance diffractometer (DIFFRAC.SUITE EVA V3—XRD Software, www.bruker.com), XPS (X-ray Photoelectron Spectroscopy) and Omicron EA-125 electron energy analyser and a dual anode X-ray source (XPS Lab, www.scientaomicron.com).

Journal: Scientific reports

Article Title: Preparation of highly wettable coatings on Ti-6Al-4V ELI alloy for traumatological implants using micro-arc oxidation in an alkaline electrolyte.

doi: 10.1038/s41598-020-76448-w

Figure Lengend Snippet: Figure 3. XRD patterns and XPS spectra of the substrate (Ctrl sample), MA01 and MA01-blasting: (A) XRD patterns after MAO coating (sample MA01), (B) XRD patterns after removal of the outer layer by blasting (sample MA01-blasting), (C) XPS spectrum Ti 2p, (D) XPS spectrum O 1s, (E) XPS spectrum Si 2p. Bruker D8 Advance diffractometer (DIFFRAC.SUITE EVA V3—XRD Software, www.bruker.com), XPS (X-ray Photoelectron Spectroscopy) and Omicron EA-125 electron energy analyser and a dual anode X-ray source (XPS Lab, www.scientaomicron.com).

Article Snippet: Bruker D8 Advance diffractometer (DIFFRAC.SUITE EVA V3—XRD Software, www.bruke r.com), XPS (X-ray Photoelectron Spectroscopy) and Omicron EA-125 electron energy analyser and a dual anode X-ray source (XPS Lab, www.scien taomi cron.com).

Techniques: Software, Spectroscopy